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Verlag: University of California, Berkeley, Lawrence Hall of Science, 1999
ISBN 10: 0924886323ISBN 13: 9780924886324
Anbieter: Better World Books, Mishawaka, IN, USA
Buch
Zustand: Very Good. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects.
Mehr Angebote von anderen Verkäufern bei ZVAB
Gebraucht ab EUR 6,24
Verlag: Elsevier Science & Technology Books, 1980
ISBN 10: 0080261728ISBN 13: 9780080261720
Anbieter: Better World Books, Mishawaka, IN, USA
Buch
Zustand: Good. Used book that is in clean, average condition without any missing pages.
Verlag: McGraw-Hill, 1943
Anbieter: Cambridge Rare Books, Cambridge, GLOUC, Vereinigtes Königreich
HARDCOVER. Zustand: GOOD. 1943-01-01. McGraw-Hill. Hardcover. ACCEPTABLE Gilt titles, black boards. Previous owners name. 9x6.
Verlag: Springer US, 2012
ISBN 10: 1461365325ISBN 13: 9781461365327
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
Verlag: Springer US, 2013
ISBN 10: 1461366674ISBN 13: 9781461366676
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The 'Denver Conference' is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: 'Surface and Near-Surface X-Ray Spectroscopy. ' The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed 'Recent Developments and Results in Total-Reflection X-Ray Fluorescence. ' Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on 'Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. ' He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.
Verlag: Methuen, 1981
ISBN 10: 0416306802ISBN 13: 9780416306804
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Buch
Zustand: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In poor condition, suitable as a reading copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:0416306802.
Verlag: Plenum, London, 1990
Anbieter: Buchhandlung-Antiquariat Sawhney, Bonn, NRW, Deutschland
Gebunden mit Schutzumschlag. Proc. 39th. Annual conf. Steamboat Spring Colo U.S.A, Chemie, 743p.
Verlag: Lulu.com, 2013
ISBN 10: 130407403XISBN 13: 9781304074034
Anbieter: Buchpark, Trebbin, Deutschland
Buch
Zustand: Hervorragend. Zustand: Hervorragend | Seiten: 74 | Sprache: Englisch.
Verlag: Springer, Berlin, 1992
ISBN 10: 0306442493ISBN 13: 9780306442490
Anbieter: moluna, Greven, Deutschland
Buch
Gebunden. Zustand: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.
Verlag: Crossway Books 2017-11-30, 2017
ISBN 10: 1433548054ISBN 13: 9781433548055
Anbieter: Blackwell's, London, Vereinigtes Königreich
Buch
hardback. Zustand: New. Language: ENG.